Puri, Pooja and Ramgiry, S R and Tripathi, M K and Solanki, R S and Tare, Shivangi (2025) Assessment of Genetic Variability, Correlation and Path Coefficient Analysis for Yield Associated Traits in Wheat (Triticum aestivum L.). International Journal of Plant & Soil Science, 37 (2). pp. 188-199. ISSN 2320-7035
Full text not available from this repository.Abstract
The present study was carried out during the two successive seasons 2020-21 and 2021-22 at the Crop Research Farm, R.A.K. College of Agriculture, RVSKVV, Sehore (MP), India. The present study evaluated genetic variability, heritability, correlation, and path analysis among diverse wheat genotypes for key agronomic traits. Significant differences (P<0.01) were observed among genotypes for all studied traits, indicating substantial genetic variability that can be utilized for selection and hybridization. Phenotypic coefficient of variance (PCV) was higher than genotypic coefficient of variance (GCV) for all traits, highlighting environmental influence. High heritability estimates were recorded for most traits, suggesting strong genetic control, whereas genetic advance as a percentage of the mean was high for traits like the number of effective tillers per plant and 1000-seed weight. Correlation analysis revealed significant positive associations of seed yield per plant with biological yield, 1000-seed weight, and the number of grains per spike at both genotypic and phenotypic levels, emphasizing their importance in yield improvement. Path analysis identified biological yield, 1000-seed weight, and harvest index as key contributors to seed yield, suggesting their prioritization in breeding programs. These findings provide valuable insights for wheat breeders aiming to enhance genetic gains and develop high-yielding wheat varieties.
Item Type: | Article |
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Subjects: | Bengali Archive > Agricultural and Food Science |
Depositing User: | Unnamed user with email support@bengaliarchive.com |
Date Deposited: | 25 Mar 2025 10:42 |
Last Modified: | 25 Mar 2025 10:42 |
URI: | http://ebookhub.promo4journal.com/id/eprint/1920 |